Tuesday 28 September 2010

Semiconductor testing

New levels of usability, convenience, and productivity for semiconductor test applications

Keithley Instruments has announced a new release of its ACS Basic Edition Semiconductor Parametric Test Software for semiconductor test and measurement applications. ACS Basic Edition Version 1.2 adds new levels of usability, convenience, and productivity in the characterization of component or discrete (packaged) semiconductor devices. It features a
Trace Mode that allows an instantaneous check of results and interactively controls voltage sweeps to avoid impending device breakdown. In addition to full support for Keithley's broad line of source-measure instrumentation, ACS Basic Edition combines high speed hardware control, device connectivity, and data management in an easy-to-use tool optimised for part verification, debugging, and analysis.

Productivity Features
ACS Basic Edition offers an incredibly rich set of quick and easy-to-access test libraries, so no programming is needed. An intuitive GUI further simplifies many types of I-V testing, data collection, and analysis. Even novice users can test a semiconductor component in seconds, generate a family of curves, and then compare them with reference curves immediately. While pre-configured tests minimise startup time, the user still has the flexibility to optimize a test or
the entire test system.

The new Trace Mode feature of ACS Basic Edition Version 1.2 supports interactive testing of a device. It can be used to map out the operating range and characteristics of a DUT while avoiding damage to the device. This interactive mode includes a convenient method of controlling the
voltage level of a sweep with either a virtual slide bar or the arrow keys on a PC keyboard.

Serving a Wide Range of Applications
ACS Basic Edition maximises productivity for technicians and engineers responsible for packaged part characterization in applications ranging from early device research through development, quality verification, and failure analysis. It will serve university researchers and
developers of novel devices equally well, aiding in the transition from pure research to commercial application. It can also be used in semiconductor facilities and companies involved in pilot production for process refinement at the component level, supporting engineers involved in QA, failure analysis, and post-production testing.

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