The built-in flash memory capacity has also been increased from 0.1 Gbyte to 0.33 Gbyte, while a new extended memory option with a capacity of 7.2 Gbyte has been introduced.
Also included are a number of enhancements to the history memory function: a unique Yokogawa capability with which the instrument can capture and replay many individual acquisitions that can be displayed one at a time or as an accumulation. Using search and measurement functions, this allows abnormal signals to be quickly isolated, analysed and precisely categorised without the need to carefully configure triggers to capture rare events.
In the enhanced DLM2000, the maximum number of history waveforms is increased from 20,000 to 50,000 and the default setting is changed to "all" so that all stored waveforms are displayed by a single click of the "history" key. Also enhanced is the zone search function, which now includes an intuitive search function covering the whole of the history waveform and is 20 times faster than the original version.
Together with a maximum continuous acquisition rate of 20,000 waveforms per second, which increases to approximately 450,000 in N Single mode, the history memory in the DLM2000 enables abnormal signals to be captured without needing to know what makes them different
Yokogawa is also offering many of its firmware packages as separate items which customers can purchase and install themselves rather than as factory-fitted options. A free trial period of one month is available for all these options.
Firmware packages include dedicated software for power-supply analysis as well as analysis of popular serial buses including automotive CAN/LIN and FlexRay trigger and analysis.
There are two or four channel models, with up to 500 MHz bandwidth and 2.5 GS/s sampling speed as well as the longest memory and fastest update rate (up to 450,000 waveforms per second) in this class of instrument. The DLM2000 Series offers a flexible combination of analogue and digital inputs, plus a large-screen display in a compact ergonomically styled body.
Combined with the advanced search and cursor/parameter measurement capabilities, two independent zoom windows enable users to see the waveform detail of two parts of the acquisition which can be separated by a long time period. It is thus possible to quickly find, measure and analyse the details of the cause and effect of an abnormality which could be on the same or different input channels. They also make it possible to view and compare the details and timings of different serial buses which are running at different speeds.
The DLM2000 is based on an easy-to-use portrait design with the large display located above the controls, enabling it to be nearer the eyes of the user and keeping the footprint on the bench to a minimum. The intuitive controls are laid out so that a user can see at a glance what channels and features are switched on and quickly make the measurements that are needed.
Users can automatically or manually split the display to separate individual channel waveforms while maintaining their full resolution and dynamic range, making it easy to see the details of all signals regardless of the number of channels in use.
The DLM2000 allows the user to choose to capture a mix of analogue and more digital signals. With a push of a button, channel 4 converts into eight digital inputs and the DLM2000 becomes a mixed signal oscilloscope. This makes it possible to view three analogue and eight digital signals simultaneously and view more control and logic signals. Digital channels can also be used to analyse I2C, SPI and UART serial buses while keeping the analogue channels available for other signals.
The hardware optimised architecture and dedicated ScopeCORE IC in the DLM2000 enable measurements and signal processing to be carried out in real time. This means that turning on more channels does not affect the waveform acquisition rate and measurements are always performed at high speed.
Other key features include powerful triggering capabilities, real-time filtering, automatic parameter measurement and statistical analysis, parameter trend and histogram displays, and FFT frequency domain analysis.
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