Friday, 25 January 2013

The latest in test, control and design!

Discover the latest in test, control and design at the 2013 National Instruments Technical Symposium at five locations in Ireland and Britain.

Commencing in February, National Instruments Technical Symposium is a one-day conference aimed at engineers and scientists interested in designing measurement, test and control systems. In-depth technical content and hands-on training is drawn from the most popular sessions at NIDays 2012, the annual graphical system design conference, to provide the most interesting and topical sessions possible.

This free one-day event hosts both a presentation and a hands-on track, which include a variety of topics on data acquisition, automated test systems and embedded systems. The hands-on sessions are ideal for delegates who have limited experience with National Instruments technology, giving them practical training in NI tools and the opportunity to ask questions to NI engineers.

Ten presentations will run throughout the day including the morning keynote, “System Design for the 21st Century” at 9:15am. The LabVIEW User Presentation will feature guest speakers and their dynamic case studies showing graphical system design in practice, such as Karol O’Donovan of Shimmer Research who will be present his wearable wireless sensors for real-time motion data at the Dublin Symposium. The “Smartphones and Tablets for Measurement and Control” session will educate delegates on the advantages of mobile computing devices for measurement and control applications.

Delegates who are proficient in LabVIEW will have the opportunity to take a Certified LabVIEW Associate Developer Exam, free of charge. There will also be a Certified LabVIEW Developer Exam preparation class, giving delegates the chance to interact with NI engineers and ask questions.

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