ADLINK Technology has released its first PXI Express controller, the PXIe-3975, a 3U PXI Express™ controller with Intel® Core™ i5-520E processor, for hybrid PXIe-based testing systems. With maximum system throughput of up to 2 GB/s, the PXIe-3975 leads the field of mid-performance PXIe testing system solutions for general purpose and electronic functional testing applications.
The ADLINK PXIe-3975 PXI Express embedded controller is built on an Intel® Core™ i5-520E 2.4 GHz processor with Intel® Hyper-Threading Technology and Intel® Turbo Boost Technology, maximizing energy efficiency and boosting performance by enabling CPU cores to run at higher frequencies. The PXIe-3975 also features up to 8 GB of 1066 MHz DDR3 memory, and a 160 GB, 7200 RPM SATA hard drive, for seamless execution in multi-tasking environments.
“ADLINK, as a sponsor member of the PXI System Alliance, in response to the requirement for increased bandwidth in PXI-based testing systems, is pleased to be expanding our PXI product line to embrace PXI Express platforms.” Catherine Wu, Director of their Measurement and Automation Product Segment said. “For automated test equipment (ATE) systems consisting of a PXI Express platform and diversified standalone instruments for complex testing tasks, ADLINK’s PXIe-3975, with a variety of I/O interface capabilities, delivers easy connection to other instruments, ideally positioning it as a core controller. ADLINK’s PXIe-3975 provides more than equal performance based on industry standards, to meet and exceed all customers’ needs.”
The ADLINK PXIe-3975 provides flexible scalability with a front panel-mounted ExpressCard/34 expansion slot. Users can extend system function with easily installed ExpressCard modules, such as ExpressCard to USB 3.0, or a bus expansion kit from ExpressCard to PXI/PCI. In addition, the ADLINK PXIe-3975 also provides ample interface flexibility, including dual Gigabit Ethernet ports, one for LAN connection and the other for controlling LXI instruments, four USB 2.0 ports for peripheral devices and USB instrument control, and a Micro-D GPIB connector for GPIB instrument connection, for hybrid PXIe-based testing systems control.
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