“We will have a full lineup of keynote speakers who will share their experiences on how NI technologies are helping them use test as a strategic differentiator,” said Ritu Favre, group president of Emerson’s Test and Measurement business. “The NI software-centric test and measurement approach will be on full display, with our R&D experts available to collaborate directly with customers. They will assist in troubleshooting challenges and developing customized strategies that are specifically tailored to meet their unique needs.”
Industry leaders delivering keynotes at NI Connect include:
- • George Kaehler, development lead at Siemens Mobility, who will discuss how Siemens uses NI software-centric product ecosystem of test hardware and software to achieve productivity gains.
• Michael O’Sullivan, vice president of Operations Engineering at Analog Devices, who will share how standardizing a unified test platform for hardware and software reduced development time and enhanced overall product performance across the life cycle from validation to production.
• Matt Fangman, senior director of Azure Data & AI at Microsoft, who will provide insights into how cloud computing, AI and software development enhance workflows across industries where reliability, repeatability and data privacy are critical.
• Steve Xie, founder and CEO of Lightwheel AI, who will share insights on how using generative AI to power synthetic data generation can provide realistic testing data solutions for autonomous driving.
Technical sessions, led by NI engineering experts and partners, include “What’s New in LabVIEW,” an intro to the NI Battery Test Software Suite and “Getting Started with LabVIEW FPGA.” The full list of topics can be found here.
To register for niConnect click on the logo.
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