Showing posts with label Trace Detection. Show all posts
Showing posts with label Trace Detection. Show all posts

Thursday, 3 November 2016

Digital Oxygen analyser.

Servomex, has launched the SERVOPRO MonoExact DF150E: a next generation digital trace oxygen analyser designed for accurate, stable and reliable performance across a wide range of industrial applications.

Combining Servomex’s Coulometric trace-level measurement into Servomex’s advanced next-generation industrial analyser platform, the MonoExact DF150E’s flexible and simple operation makes it ideal for use in applications as diverse as glove boxes, heat treating, solder reflow ovens, laboratory and industrial gas production.

Operation is simple, with the MonoExact DF150E’s touchscreen graphical interface giving users immediate and intuitive control of all control and reporting parameters. The MonoExact DF150E’s measurement performance is optimized through Servomex’s tried and tested Coulometric sensor – delivering the same accurate oxygen measurement as its predecessor in a even more user-friendly platform.

The MonoExact DF150E is also fully backward-compatible with its forerunner, the DF-150E, offering full connectivity with existing hardware wiring inputs and gas inlets, ensuring full compliance with existing standards and customer agreements. Integration into existing systems is equally simple, with optional built-in 4-20mA output and alarm outputs supported by added Relay I/O.

Jim Belanger, Global Market Sector Manager at Servomex, explains: “The MonoExact DF150E advances and standardises a complete, integrated analysis capability through the latest innovations in software and hardware. This delivers what our customers want: effective functionality, ease of use, low maintenance and a low cost of ownership.”


@Servomex #PAuto 

Monday, 4 April 2016

VA purgemeters with surface passivation for trace-level analysis.

Optional surface treatment for all wetted parts to eliminate surface adsorption of chemically active compounds in analyser feed

Krohne now offers the option of surface passivation for trace-level analysis for its variable area flow meters DK 32, DK 34 and DK 37.

Trace-level analysis is used for providing evidence of very small concentrations in the range of ppm (parts per million) to ppb (parts per billion). Here, it is very important that none of the particles to be detected are already adsorbed in the sample feed line as this would lead to a delayed or even wrong analysis result. Examples are the measurement of H2S content in natural gas or oil, mercury, or NOx/SOx flue gas analysis in various industries.

To avoid adsorption, sample feed lines, fittings and valves can be surface passivated. This can now also be applied to the DK 32, DK 34 and DK 37 all-metal purgemeters that are used for adjustment and monitoring of the sample flow to the analyser.

Before being assembled and calibrated, all metal components in contact with the medium such as cone, float, valve components, etc., receive a SilcoNert 2000 inert silicon coating, a patented surface treatment at a temperature of 400°C / 752°F. The same is possible for wetted metal components of DK 46, DK 47, DK 48 and DK 800 glass devices.

• SilcoNert 2000 is a registered trademark of SilcoTek.

#Krohne #PAuto

Tuesday, 5 July 2011

Trace gas analyser for SF


Tiger Optics is continuing to expand the capabilities of its patented CW-CRDS technology, and has just announced plans to introduce the LaserTrace 3TM trace gas analyzer at the Semicon West trade show in San Francisco (US). The LaserTrace 3 can detect moisture, oxygen, methane, and other analyte contaminants at limits that are more than two times (2X) lower than previous generations of the product line.

Tiger, in the industry vanguard, sells laser-based trace gas analyzers to semiconductor manufacturers, tool manufacturers, purifier manufacturers and the gas companies that supply bulk and specialty
gases to the industry. In semiconductor manufacturing, contamination in process gases has a destabilising effect and negatively impacts deposition processes. As a result of as little as single-digit
parts-per billion impurities in process gases, product yields are reduced. To remedy this problem, the LaserTrace 3 allows users to monitor for intrusions at levels that were never previously available.


“The leading semiconductor manufacturers have adopted our patented CW-CRDS technology due to the superior detection range, ease of use, the lowest total cost of ownership in the industry, and the fact
that this is an absolute technology. No calibration gases are required,” said Lisa Bergson, Tiger’s founder and chief executive. “In order for our customers to meet targets for the 15-year International Technology Roadmap for Semiconductors, they need to monitor their process gases at ever increasing levels of purity. The technological advancements of the LaserTrace 3 are a result of Tiger Optics’ on-going investment in research and development. We’re thrilled that our customers will now be able to realize a two-fold improvement in their detection limits.”

Since its debut in 2003, the LaserTrace platform has been widely accepted for semiconductor applications, based on its versatility, ease-of-use, and low cost-of-ownership. The multi-species,
multi-point, multi-gas product line accommodates up to four sensor modules in a standard 19-inch rack, or permits placement of individual sensor models as far as 200 feet from the computerized control unit. In 2005, the company introduced its LaserTrace O2 as the world’s first laser-based, trace oxygen analyzer to detect parts-per-trillion levels in ultra-high-purity gases. In 2008, the LaserTrace+
made possible the lower detection limit (LDL) of 200 parts-per-trillion, affording the widest dynamic range of any dedicated analyzer currently in the market.

Wednesday, 29 September 2010

New trace detection technology attracts huge interest!

New trace detection technology offers improved security

Quantitech has reported enormous levels of interest in a new trace detection technology that was launched at this year's Transport Security Expo at London's Olympia (GB).

The new technology was developed by TeknoScan Systems of Canada and their Vice-President Larry Wardrop was present at the Quantitech booth to explain the many advantages of the new instrument over existing techniques. Commenting on the success of the event, Larry said: "A considerable amount of time and money has gone into the development and assessment of this technology, so we were delighted to receive such an enthusiastic reception at the Expo."

The TeknoScan TSI-3000 is a highly sensitive and selective portable system for detecting banned substances, capable of simultaneously detecting target substances from a library of up to 50 separate compounds, providing complete analysis of a sample in 3 minutes or less. A major feature of the equipment is the virtual elimination of false alarms.

During field trials, TeknoScan demonstrated detection and identification of threat substances from samples as small as 0.1 nanograms in a polluted environment. Therefore, there is an extremely high probability of detection if an individual, object or container has been in contact with a target substance, even if masking agents are present.

Quantitech’s Managing Director Keith Golding said: “There are three important features to this new technology. Firstly, samples are acquired by aspiration and we are able to detect substances both in the volatile state and attached to other tiny particles of dust. Secondly, the number of false alarms is dramatically reduced by concentrating and purifying the sample with a number of sequential techniques, and thirdly, it is a networkable product that can be updated as and when new drugs or explosives become a threat. "A reliable technology for detecting banned substances on passengers and in freight cargo is critically important to every aspect of security, so we are very excited about the prospects for the TeknoScan technology."