Full wafer-level support including high voltage capacitance-voltage testing!

Keithley Instruments has introduced new enhancements to its Parametric Curve Tracer (PTC) configurations that incorporate high power SourceMeter® Source Measure Unit (SMU) instruments. For test engineers responsible for configuring high power semiconductor test systems, the new Keithley Model 8020 High Power Interface Panel improves connectivity and simplifies complex measurements like high voltage capacitance-voltage (C-V) measurements. The Model 8020 reduces set-up times, minimizes opportunities for connection errors, improves operator and test hardware protection, and increases users’ confidence in the accuracy of their results. For more information, watch Keithley’s introductory video on the topic (right).

Characterizing high power semiconductor devices like power MOSFETs, IGBTs, diodes, etc. involves several different types of measurements: on-state (high current current-voltage), off-state (high voltage current-voltage), and capacitance-voltage (C-V) at high bias voltages. However, each of these measurements requires the use of different instrumentation, cabling, connectors, and probes (for wafer-level testing) or test fixtures (for packaged device testing).

In the past, no standardized solutions for combining high power instruments, interconnects, and probers/test fixtures suitable for all three test types in the same test station were commercially available. When changing from one measurement type to another, high power test system users once had to change the type of cables used manually, as well as critical hardware in the signal path between the device under test and the test instrumentation. High voltage C-V testing was particularly complicated because no standard or reliable measurement setups and methods were established. Test engineers often had to develop their own connection solutions through trial and error, which is not only expensive and time-consuming but can create an unsafe work environment, given the high outputs involved in testing power devices.

The configurable Model 8020 High Power Interface Panel allows test engineers to select the options that match their system’s probe station, positioners, or fixture. It also improves safety for both users and any low power SMU instruments in the system, simplifies incorporating different combinations of instruments, as well as taking the confusion out of adding elements like series resistors and bias tees to the signal path.

The Model 8020 simplifies changing from one measurement type to the next by allowing test engineers to connect all measurement instruments to it at once, making further connection changes unnecessary. When the Model 8020 is configured with optional C-V bias tees on the system’s 3kV and 200V channels, it acts as a high performance I-V/C-V switch, allowing users to perform both I-V and C-V testing without re-cabling.

The Model 8020 provides input connections for Keithley Model 2657A (3kV) and 2651A (50A) High Power SourceMeter SMU instruments, Model 2636B and 2612B SourceMeter SMU instruments, and Model PCT-CVU Multi-frequency C-V Meter. Various user-configurable output connectors are available to accommodate almost any probe station.

The Model PCT-CVU Multi-frequency C-V Meter, which supports C-V measurements from 10kHz to 2MHz, can be used to upgrade any Keithley PCT configuration to include 2- and 3-terminal capacitance measurements. It is designed for use with the new Model CVU-200-KIT bias tee kit to extend the voltage bias to 200V or the Model CVU-3K-KIT bias tee kit to extend it to 3kV to support both AC and DC testing in the Model 8010 or other high power test fixture.

The latest version (V 2.1) of Keithley’s ACS Basic Edition Component Test Software expands the package’s support for I-V and C-V measurements on devices like power MOSFETS, IGBTs, diodes, etc. It complements the advanced C‑V measurements the Model 8020 and new bias tee kits make possible.

Smart device app for source measure unit (SMU) instruments!

Keithley Instruments has developed a free app for Android™-based smartphones and tablets that interacts with a Keithley Series 2600B SourceMeter SMU instrument via its front panel USB interface. IVy, which is the industry's first app developed for SMU instruments. This extends Keithley's Touch, Test, Invent® design philosophy to offer benchtop Series 2600B instrument users a fast, easy-to-use touchscreen tool for characterizing 2- and 3-terminal devices. By leveraging the power of smart mobile devices, IVy transforms the Series 2600B into a powerful instrument that enables users to visualize, interact, and share measurement results more efficiently, while helping them gain a deeper understanding of their devices behavior.

Unlike other instrument apps, IVy is more than just a tablet/smartphone version of a front panel. IVy leverages a smart device's built-in display (pan/pinch/zoom/swipe), computing (interaction with the instrument), and communication (WiFi, email, etc.) capabilities so users can visualize measurement data, interact with the instrument, and share results easily - all without programming. Like all Keithley Touch, Test, Invent solutions, the IVy app is designed to help instrument users "learn faster, work smarter, and invent easier." It helps users gain deeper insight into their device under test (DUT) performance by allowing them to toggle quickly between test modes, observe a DUT's response over time, and analyze results interactively by using fingertip control. IVy is compatible with any Android (V 4.0 or later) smartphone or tablet and the latest release (V 3.1.0) of the Series 2600B firmware 

IVy's patent-pending design provides for simultaneous control over the source level (using an on-screen slider) and monitoring of test results (on the smart device's graphical display). This unique capability makes it easy to analyze I-V characteristics, DUT stability, response time, or drift in a circuit visually. Changes in DUT performance are reflected instantly on the graphical display, and further analysis or troubleshooting is simplified by pinching, zooming, or scrolling. IVy also simplifies the process of sharing test results by utilizing built-in smart-device capabilities such as cellular, WiFi, Bluetooth, email, or other apps such as Dropbox, Google Drive, and more. This capability can be invaluable when collaborating on a task or project.

The Keithley Series 2600B SourceMeter SMU instruments are available in both single- and dual-channel models that combine the capabilities of a precision power supply, true current source, 6½-digit multimeter, arbitrary waveform generator, pulse generator, and electronic load in one tightly integrated instrument. They offer industry-leading resolution (up to 0.1fA) and dynamic range (up to 3A or 200V).

Redefining the SMU with industry-leading speed, density and flexibility!

National Instruments has announced the NI PXIe-4139 system source measure unit (SMU), a high-performance addition to the company’s SMU portfolio. This SMU can reduce overall cost of test and accelerate time to market for test engineers in a broad range of industries, from semiconductor to automotive and consumer electronics.

Key Features: • 100 fA current measurement sensitivity: Precisely characterise high-performance semiconductor devices. • 1.8 MS/s sampling rate: Capture transient device characteristics without an external scope. • Up to 17 SMU channels in 4U 19 in. rack space: Minimise test system footprint for high-channel-count systems. • SourceAdapt technology: Reduce transient times to improve overall test times and protect the device under test from overshoots and oscillations even on highly inductive or capacitive loads.

“With the NI PXIe-4139, engineers and scientists get broad IV boundaries, including extended range pulsing capability up to 500 W and sensitivity down to 100 fA, to test a wide range of devices with a single instrument,” said Luke Schreier, Senior Group Manager of Test Systems for National Instruments. “The compact size of the NI PXIe-4139 is also critical. It can reduce system footprint significantly compared with legacy box instrument SMUs.”
The NI PXIe-4139 features NI SourceAdapt technology to help engineers produce optimal SMU response to any load by customising the SMU control loop. This protects devices under test and improves system stability. Additionally, the NI PXIe-4139 system SMU can take measurements at 1.8 MS/s, which is 100X faster than traditional SMUs. This helps reduce test time and offers engineers the ability to capture transient device behaviour without an external scope.

“A redefined approach to instrumentation is necessary if you want to keep pace with the increasing complexity of modern electronics,” said Schreier. “SourceAdapt technology, coupled with the inherent benefits of PXI modular instrumentation and NI LabVIEW system design software, gives engineers a competitive edge in reducing test times and protecting their devices under test.” 

Source Measure Unit (SMU) instrument!

Keithley Instruments have announced the first benchtop Source Measure Unit (SMU) instrument with a capacitive touchscreen graphical user interface. The Model 2450 SourceMeter® SMU Instrument combines the intuitive touchscreen and icon-based control that novice SMU users can appreciate with the exceptional versatility that experienced users need to learn faster, work smarter, and invent easier.

The Model 2450’s design, Keithley’s latest generation of SMU instruments, offers a fundamentally new way for users to interact with test and measurement instruments. It is based on the company’s innovative “Touch, Test, Invent™” design philosophy.

This new design philosophy reflects recent market changes, including shrinking product design/development cycles and fewer personnel devoted exclusively to test engineering tasks. At the same time, the profile of the typical instrument user has also evolved. In addition to electrical engineers, it now includes a growing number of non-engineers (such as electrochemists, physicists, materials scientists, etc.) who need fast access to data but sometimes have limited training in electrical measurement. Additionally, as the previous generation of electrical engineers has retired, their younger replacements have tended to be more software oriented than hardware oriented. To accommodate all of these market and user changes, the Model 2450 incorporates numerous ease-of-use features that ensure a faster “time-to-answer” than competitive solutions, including a context-sensitive help function, “Quickset” modes that speed instrument configuration, and on-screen graphing capabilities that quickly turn raw data into usable results.

The Model 2450 builds on the design strengths and high precision of both the Model 2400 SourceMeter SMU instrument (an industry standard since its 1995 introduction) and the newer Series 2600B System SourceMeter SMU Instrument line. The Model 2450 combines the functionality of a power supply , true current source, 6-1/2-digit multimeter , electronic load, and trigger controller in one tightly integrated, half-rack instrument. With all of these capabilities, the Model 2450 integrates the capabilities of I-V systems, curve tracers, and semiconductor analysers at a fraction of their cost.

Benchtop Application Advantages
Many of the Model 2450’s features help speed and simplify lab/benchtop work:
• Full-color, 5-inch touchscreen user interface: The full-color display and large on-screen characters enhance legibility. A simple, icon-based menu structure allows reaching any measurement set-up panel with just a touch.
• Extended measurement ranges with superior low current performance: The new low current (100nA, 10nA) and voltage (20mV) ranges eliminate the need to add separate low-level instruments to a benchtop system. Back-panel triax cable connections eliminate the need for expensive cable adaptors, which can degrade low-level measurement performance.
• Built-in context-sensitive help function: Help information is provided right where it’s needed through the touchscreen, minimizing the need to review a manual.
• Error and event logging: The touchscreen displays error messages and an event log to simplify diagnosing instrument errors, for higher productivity.
• KickStart start-up software: This “no-programming” instrument control software simplifies taking and graphing data in minutes. For more complex analyses, data can be easily stored to disk, and then exported to Microsoft Excel® or another software environment.

System-Level Application Advantages
Several features simplify integrating the Model 2450 into automated test systems:
• Embedded Test Script Processor (TSP®): An onboard Test Script Processor embeds complete test programs into non-volatile memory within the instrument itself to provide higher test throughput by eliminating the GPIB traffic problems common to systems dependent on an external PC controller.
• TSP-Link® inter-unit communication bus: Unlike users of mainframe-based systems, Model 2450 users are not constrained by power or channel count limitations. TSP-Link connections support system expansion with multiple 2450s and other TSP instruments, including Series 2600B SMU instruments and the Model 3706A Switch/Multimeter. Up to 32 Model 2450 instruments can be linked for multi-point or multi-channel parallel test, under the direction of a master unit’s TSP controller.
• Model 2400 legacy mode: In addition to its native 2450 SCPI operating mode, the Model 2450 offers a 2400 SCPI operating mode for backward compatibility with existing 2400 SCPI programs. This preserves Model 2400 users’ software investments and eliminates the re-work normally associated with upgrading a system with a new instrument.
• PC connectivity and automation: Rear panel triax connectors, multiple instrument communication interfaces (GPIB, USB 2.0, and LXI/Ethernet), a D‑sub 9-pin digital I/O port (for internal/external trigger signals and handler control), instrument interlock control, and TSP-Link® jacks simplify configuring multi-instrument test setups.