"The collaboration between Emerson and Advantest will enable smarter, faster decision-making at the edge, enabling our customers meet the demands of tomorrow’s technology," said Michael Chang, Vice President and General Manager, Advantest Cloud Solutions
"The collaboration between Emerson and Advantest combines our strengths to create a powerful, AI-driven test ecosystem that optimizes efficiency, yields, and enables the highest standards of quality and reliability for semiconductor companies,” added Rudy Sengupta, VP & General Manager of Test and Analytics Software, Emerson Test & Measurement
The semiconductor industry underpins today’s modern world, and with the ever-increasing demand for more end products, developed faster and with higher quality, innovation is paramount. The partnership between Emerson and Advantest is intended to usher in a new era of intelligent manufacturing, enabling real-time decision-making throughout the entire testing process. Pushing complex computing and analysis capabilities to the edge, closer to the equipment, allows for faster and more efficient test processes and enables immediate action such as re-binning and adaptive testing.
Emerson and Advantest’s partnership utilises both companies’ strengths to deliver real-time decisioning in a responsible manner. Key benefits include:
- Optimized Efficiency and Yield: The AI-driven test ecosystem enhances operational efficiency and yield, enabling the highest standards of quality and reliability for semiconductor companies.
- Real-Time Decision Making: The companies’ strengths will enable real-time decision-making throughout the entire testing process by using the system architecture that streams the real-time data, pushes compute and analysis capabilities to the edge.
- Scalable and Flexible Solutions: The open and extensible platform supports the development, simulation, publication, and activation of an AI/ML models at the ACS
- Real-Time Data Infrastrucutre™, accommodating both proprietary and third-party algorithms.
- Consistent Improvements Across Test Stages: The area-agnostic solution applies the same architecture and concepts across wafer sort, final test, and system-level test, enabling consistent improvements throughout the testing process.
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