Emitters, Detectors and LEDs for Wearables.

Marktech the designer and manufacturer of standard and custom optoelectronics components and assemblies, including UV, visible, near-infrared (NIR), and short wavelength infrared (SWIR) emitters, detectors, InP epiwafers and other materials, has announced its dedicated offerings for wearables.

Their standard and custom emitters and detectors, in both multi-wavelength and hybrid designs and in UV, visible, infrared, and SWIR ranges, are routinely specified within consumer- and hospital-grade flexible, stretchable and wearable devices. Some of the most common wearable applications supported by Marktech include consumer-grade fitness trackers; high-end cardiac, oxygen, and blood pressure monitors; audiological diagnostic devices, used to detect inner ear abnormalities and damage; non-invasive optical chemical sensing; and indoor/outdoor UV-level detection.

For wearable designs requiring more advanced onboard monitoring and detection capabilities, Marktech offers a number of multi-wavelength emitter-detector combinations. These combinations may be seamlessly integrated into a single package along with a multi-wavelength range detector. In addition, their Silicon and InGaAs photodetectors may be similarly combined with its GaP Schottky UV photodiodes, creating an expanded spectral detection range of approximately 150 nm to 1750 nm. Optoelectronics assemblies are available in plastic, ceramic, and glass-to-metal (hybrid) package types. A number of options are also available to effectively address specialty requirements for hermetic sealing, temperature extremes, and humid or moisture-rich environments.

In addition, their high-brightness LEDs and LED emitters are routinely specified for wearable displays and remote physiological monitoring requirements. Standard LED emitters are offered in wavelengths from 280 nm to 1720 nm, with expanded wavelengths by special request. The LED emitters can be further optimized for low power consumption. Such optimizations can result in increased wearable device battery life, while still maintaining required output levels. The achievement of operating currents of 2 mA or less are also possible. In applications requiring the incorporation of a white LED, an assortment of color temperature and CRI are available, as well as lower-profile direct-attach (DA) type chip packages.

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A new type of cold field emitter SEM

Hitachi High-Technologies has released of the new SU8200 series FE-SEMs – a range of high-performance instruments which provides the perfect fusion of high resolution imaging and analysis. Employing a new type of cold field emission (CFE) gun the SU8200 combines the inherent high resolution and brightness of conventional CFE with previously unseen beam stability and probe currents.

The latest trends in advanced materials research mean increasing requirements to image and analyse light-element and beam-sensitive materials such as those used in lithium-ion batteries, fuel cells, catalysts or novel electronic devices. Characterising these modern materials requires extended SEM capabilities beyond pure resolution. Quality imaging at low and ultra-low acceleration voltages is critical to mitigate beam damage and reveal the true material properties. Highly sensitive elemental analysis is also required to fully understand the materials. The SU8200 addresses these needs better than any previous instrument.

The heart of the new SU8200 series is the innovative CFE source. This novel CFE gun employs a new vacuum system and a Hitachi patented technique to greatly reduce gas molecule deposition on the emitter tip. The emitter always operates in a “clean” state, and emission current and beam stability are significantly improved. The result is the ultimate SEM electron source offering high S/N ratio, high stability and incredible resolution performance at all accelerating voltages. The enhanced stability and probe current provides opportunities for enhanced low voltage elemental microanalysis. The SU8200 series supports a variety of large-diameter silicon drift detectors (SDDs) for high spatial resolution, high sensitivity, and high speed X-ray detection.

The new dual-in-lens detector system offers the most sensitive and flexible electron detection system available. Fine contrast differentiation is now achieved by selectively filtering inelastic scattered electrons and directly detecting specific energy back scattered electrons. This selective filtering is particularly powerful for enhancing material contrast at low acceleration voltages.

Careful attention to detail during the instrument design, including measures for vibration control and enhanced optical stability contribute to the high resolution performance.

The SU8200 series includes three models (SU8220, SU8230, and SU8240) offering various stage, chamber and detector configurations for a wide range of imaging and analytical applications.