60 HZ optical samplig oscilloscope.

4-Channel Oscilloscope streamlines evaluation of advanced optical transceivers for AI datacentres

Anritsu Corporation has launched the MP2110A-080, a 60 GHz optical sampling oscilloscope option for the BERTWave MP2110A. This solution enables accurate measurement of key optical signal parameters as defined by industry standards, supporting the development and manufacturing of 200G/Lane and 1.6T optical transceivers for high-capacity data centres and AI infrastructure.

As AI data centres push transmission rates from 50 Gbaud to 100 Gbaud, engineers require test solutions capable of accurate evaluation of optical transceiver signals according to standard requirements.

Technical Challenge: Bandwidth Scaling for 200G/Lane Systems.
The transition to 200G/Lane transmission introduces fundamental measurement challenges. Traditional test equipment lacks sufficient bandwidth to capture the harmonic content and high-frequency distortions that become increasingly critical at 100 Gbaud PAM4 signaling rates. This bandwidth limitation makes it difficult to accurately measure key optical parameters required by industry standards, potentially allowing important characteristics to escape detection during development and manufacturing validation.

The shift from 800G to 1.6T aggregate data rates compounds this challenge, as multiple high-speed lanes must be simultaneously evaluated without compromising measurement accuracy or throughput requirements. The technology will be demonstrated Anritsu’ stand C4335 at ECOC 2025 (Copenhagen, September 29-October 1), showcasing real-world applications in 1.6T transceiver validation and AI data centre infrastructure testing.

Product Features Engineering Solution: 60 GHz Sampling Architecture The MP2110A-080 employs a 60 GHz sampling front-end specifically designed to capture the spectral components essential for accurate PAM4 TDECQ (Transmitter Dispersion Eye Closure Quaternary) measurements at 200G/Lane rates. This bandwidth extension enables engineers to: Characterize high-frequency signal degradation mechanisms previously invisible to lower-bandwidth instruments Validate compliance with emerging 200G/Lane standards requiring accurate measurement of eye closure penalties Identify intersymbol interference patterns that manifest only in the extended frequency domain Key Technical Specifications: 60 GHz optical sampling bandwidth - supports PAM4 signals up to 120 Gbaud 4-channel simultaneous measurement - enables multi-lane transceiver characterization 4x faster sampling speed - reduces measurement latency for high-throughput manufacturing Integrated reference receiver performance - maintains TDECQ measurement accuracy across extended bandwidth Software-upgradeable channel count - provides scalable deployment path from 2 to 4 channels

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