Source measurement unit.

Expedites the development of semiconductor devices

The AQ2300 series high-performance, high-speed SMU (Source Measure Unit) has been released by Yokogawa Test & Measurement in the European market. It addresses various density needs for semiconductor/communication devices and offers high-quality pulse generation alongside high-precision voltage/current generation and measurements. Its inherent productivity and expandability characteristics means that the 2-channel SMU module also saves time and space when performing the typically complex measurement functions essential for semiconductor devices.

Development background.

The proliferation of smartphones and tablets, the rise of AI, and the expansion of autonomous vehicles is increasing the need for communication infrastructure to enhance speeds and address future power demands. For laser devices in particular, engineers must undertake accurate sourcing of the mainly current signals that optimise laser control, adjusting the inputs accordingly to measure the precise output of laser light. Yokogawa therefore set about developing its new AQ2300 series SMU with high levels of precision, functionality and modularity to keep pace with the miniaturisation of next-generation devices and the increasing complexity of measurements required for R&D evaluation.

The highly modular AQ2300-Series SMU allows users to select the number of channels required (up to 18) to meet system needs within a limited space, supporting efficient facility operation.

High-quality pulse waveform generation (50 μs-width) is also an important feature. This function suppresses the heat generated by the device during testing, making more accurate measurements possible. The rise and fall times may be disturbed due to the device or wiring, but by adjusting the parameter settings, a smooth output waveform can be achieved.

Interoperability is a further feature of note. AQ2300 series SMUs have trigger ports not only on the frame side, but also on each SMU channel. Moreover, in-frame synchronisation functionality allows flexible selection of the connection method. In total, three trigger synchronisation functions are available:

• Synchronisation of frames with external equipment
• Synchronisation of SMU channel with external equipment
• Synchronisation between SMU channels.

The frame can also feature a digital I/O interface that enables co-operation with external devices. Frames are available in 3-slot or 9-slot types and suit flexible adaptation to small and medium-sized measurement systems. Importantly, the AQ2300 series SMU provides flexible measurement timing control in support of better overall system performance.

Regarding productivity, the AQ2300 series offers the ability to perform simultaneous measurements of voltage and current. Furthermore, by accelerating communication within the frame and between a PC, the new SMU fosters elevated levels of work efficiency, where high-speed data transfer reduces the total measurement time and significantly enhances operational efficiency.

Major Target Markets: - R&D institutes developing new advances in optical communication devices - Manufacturers of optical semiconductor components such as laser diodes, photo diodes, LEDs and modulators - Manufacturers of electrical semiconductor components that include transistors and FETs (field-effect transistors) Applications: - Static testing of laser diode modules: The AQ2300 series SMU can generate different voltages or currents from several channels and use the sweep synchronization function to measure the I/V or I/L characteristics of optical communication devices like laser diodes. It can also perform wavelength-I measurements on photo diodes in synchronisation with a tunable light source. - Filter characteristic testing of WDM (wavelength division multiplexing) photo-diode modules: The AQ2300 series SMU can generate different voltages or currents from several WDM channels and use the sweep synchronisation function to measure the filter characteristics of each individual channel

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