Friday, February 19, 2010

Ultra-fast current voltage system

Keithley Instruments has introduced the Model 4225-PMU Ultra Fast I-V Module, the latest addition to the growing range of instrumentation options for the Model 4200-SCS Semiconductor Characterization System.

Model 4225It integrates ultra-fast voltage waveform generation and current/voltage measurement capabilities into the Model 4200-SCS’s already powerful test environment to deliver the industry’s broadest dynamic range of voltage, current, and rise/fall/pulse times, expanding the system’s materials, device, and process characterization potential dramatically. Just as important, the Model 4225-PMU makes ultra-fast I-V sourcing and measurement as easy as making DC measurements. Its wide programmable sourcing and measurement ranges, pulse widths, and rise times make it well-suited for applications that demand both ultra-fast voltage outputs and synchronized measurement—from nanometer CMOS to flash memory. For more information, visit http://keithley.acrobat.com/p77402742/.

Unlike previous solutions, which required up to three different test stands to characterize a device, material, or process thoroughly, the Model 4225-PMU’s broad dynamic range allows characterizing the full range of materials, devices, and processes with a single set of instrumentation. Now, labs can configure one flexible system to handle all three measurement types: precision DC I-V (Model 4200-SMU), AC impedance (Model 4210-CVU C-V Instrument), and ultra-fast I-V or transient I-V (Model 4225-PMU).

Two Channels of Integrated Sourcing and Measurement in a Single Module
Each 4225-PMU module provides two channels of integrated sourcing and measurement but takes up only one slot in the nine-slot chassis. Each chassis can accommodate up to four modules for a maximum of eight ultra-fast source/measure channels. Each channel combines high speed voltage outputs (with pulse widths ranging from 60 nanoseconds to DC) with simultaneous current and voltage measurements. The module provides high speed voltage pulsing with simultaneous current and voltage measurement, at acquisition rates of up to 200 megasamples/second (MS/s) with 14-bit analog-to-digital converters (A/Ds), using two A/Ds per channel (four A/Ds per card). Users can choose from two voltage source ranges (±10 volts or ± 40 volts into 1 megaohm) and four current measurement ranges (800 milliamps, 200 milliamps, 10 milliamps, 100 microamps).

Optional Hardware Expands Source-Measure Flexibility
Each Model 4225-PMU can be equipped with up to two optional Model 4225-RPM Remote Amplifier/Switches, which provide four additional low current ranges. They also reduce cable capacitance effects and support automatic switching between the Model 4225-PMU, the Model 4210-CVU, and other SMUs installed in the chassis. The Model 4220-PGU Pulse Generator Unit, which offers a voltage-sourcing-only alternative to the Model 4225-PMU, is also available.
Broad Array of Material, Device, and Process Characterization Applications
Together, the 4225-PMU and 4225-RPM provide all the tools necessary to perform a broad array of applications that no other single instrument chassis can support. Some key application areas include:
  • General-purpose ultra-fast I-V measurements. Pulsed I-V testing has a wide variety of uses, including preventing device self-heating by using narrow pulses and/or low duty cycle pulses rather than DC signals.
  • CMOS device characterization. The 4225-PMU/4225-RPM's high speed voltage sourcing and current measurement sensitivity make them well-suited for CMOS device characterization, including high-K devices and advanced CMOS technologies like Silicon-on-Insulator (SOI).
  • Non-volatile memory device testing. The system's KTEI software includes toolkits for testing both flash and phase change memory (PCM) devices. The system is well-suited for testing single memory cells or a small array, such as in R&D or process verification.
  • Characterizing compound semiconductor devices and materials. The Model 4225-PMU is useful for characterizing III-V materials, such as gallium nitride (GaN), gallium arsenide (GaAs), and other compound semiconductors. It allows setting a pulse offset voltage so measurements can be made from a non-zero value, for investigating the amplifier gain or linearity of a device.
  • NBTI/PBTI reliability tests. The optional Model 4200-BTI-A Ultra-Fast BTI Package combines all the hardware and software needed to implement all known BTI test methodologies with the fastest, most sensitive measurements available. In addition, Automatic Characterization Suite (ACS) software supports full wafer- and cassette-level automation and includes NBTI/PBTI test libraries with easy-to-use GUIs.
Four Programmable Sweep Options
The Model 4225-PMU can generate four types of sweeps: Linear Sweep, Pulsed, Arbitrary Waveform, and Segment ARB® (patent pending). The Segment ARB mode simplifies creating, storing, and generating waveforms made up of up to 2048 user-defined line segments for exceptional waveform generation flexibility.
High Performance Cabling
An optional multi-measurement performance cable kit connects the Model 4200-SCS to a prober manipulator, simplifying switching between DC I-V, C-V, and ultra-fast I-V testing configurations, eliminating the need for re-cabling, and enhancing signal fidelity.

All three products will be available beginning in May 2010.

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