Monday, April 30, 2012

Top trends influencing the automated test industry

 
The biennial Automated Test Summit, hosted by National Instruments returns to the Royal Berkshire Conference Centre at Madejski Stadium in Reading (GB) on Thursday 21st June 2012. Featuring technical training, demonstrations, industry experts, product developers and system integrators, this free, full-day conference and exhibition gives attendees the opportunity to learn more about the top trends currently influencing the automated test industry.

Through technical presentations, attendees will explore the latest technologies for virtual and synthetic instrumentation, including new hardware technologies for RF and wireless; real-time and hardware-in-the-loop test; and the benefits of a flexible, software-defined approach to automated test.   


Presentations from industry experts include Fernando Solorzano, Automation Hardware Test Engineer from BSkyB, who will talk about the system he has implemented to test BSkyB’s set-top boxes. Using National Instruments PXI-based modular instruments and open software, such as NI LabVIEW, NI TestStand, NI Audio Master and the NI Video Measurements Suite, he has dramatically reduced the test time by a factor of three, from man days to only a few hours. This also provides the flexibility to concurrently test multiple set-top boxes.


In his Keynote presentation, Luke Schreier, National Instruments Senior Group Manager for Automated Test, will highlight each of the 5 trends in the 2012 Automated Test Outlook, a comprehensive view of key technologies and methodologies that are impacting the test and measurement industry.

The Summit offers a choice of 10 hours of hands-on sessions, giving attendees the chance to experience RF systems on PXI and build an automated test system with PXI and NI TestStand.  The accompanying exhibition is to showcase 11 systems integrators and sensors manufacturers, providing an excellent networking opportunity. 

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