A micrometer win.

The QuantuMike MD-E, from Mitutoyo, is a high-speed, high-accuracy digital micrometer, has been selected as a winner of the iF Design Award 2026 in the Product Design category.

The iF Design Award is one of the most respected international design competitions, evaluated by an independent panel of design experts. Receiving this award highlights Mitutoyo’s ongoing commitment to innovation, design excellence, and the continuous development of products that meet evolving customer needs. It recognises not only the technological achievements of the QuantuMike MD-E, but also Mitutoyo’s dedication to advancing precision measurement solutions for modern industry. The QuantuMike MD-E integrates cutting-edge measurement technology with outstanding usability. Its design delivers:

• High-speed measurement, with a spindle feed of 2 mm per revolution, four times faster than conventional micrometres, significantly increasing productivity in repetitive inspection tasks.
• Exceptional precision, with ±1 μm accuracy, ensuring reliable results in demanding industrial quality control environments.
• Compliance with the latest metrological standards, meeting Class 1 specifications according to the EN ISO 3611:2023 standard, ensuring the highest level of measurement reliability and conformity with current international requirements.
• Enhanced user support features, including approach speed warnings, calibration schedule alerts, and intuitive display functions for efficient tolerance evaluation.

At the core of the QuantuMike MD-E is its innovative high-speed spindle mechanism, engineered to maintain smooth operation and stable measuring force even at increased feed rates. This allows operators to perform faster measurements without compromising repeatability or accuracy. The advanced mechanical design reduces inspection time while supporting consistent measurement confidence.

The high-resolution digital sensing system ensures precise data capture across the entire measuring range. Combined with a robust and durable frame construction, the instrument is built to withstand intensive daily use in production environments. Its ergonomic form and optimised control layout provide comfortable handling, while the clear digital display improves readability and reduces operator error. In addition, the instrument’s metrological performance is designed to comply with the latest EN ISO 3611:2023 requirements, ensuring dependable and standardised measurement results.

The QuantuMike MD-E also supports bidirectional communication, enabling seamless integration into digital quality management systems and modern manufacturing workflows. This connectivity enhances traceability and supports data-driven production processes.

Engineered for industries where speed and accuracy are essential, including aerospace, automotive, medical technology, and general manufacturing, the QuantuMike MD-E is designed for professionals who demand reliable measurement tools that combine performance, durability, and ease of use.

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@mitutoyo @mepaxIntPR #TandM 

High-speed optical micrometer with 16,000 Hz sampling rate

No moving parts design high-speed optical micrometer with 16,000 Hz sampling rate; for ultra-high speed and accuracy, is available from Keyance. Conventional micrometers have typically adopted a "laser scan method" using physical moving parts, resulting in a limitation on the ability to improve speed and accuracy. The LS-9000 Series utilises a "high-speed exposure CMOS + high-intensity Green-LED" method that eliminates the need for moving parts, achieving further improvements in speed and accuracy. The elimination of moving parts also gives the model extremely high durability and longevity.

High-speed measurement
Fitted with a high-speed exposure CMOS and high-intensity Green-LED, the LS-9000 Series has achieved the fastest sampling rate in its class (16,000 Hz). Even fast-moving targets can be measured accurately at narrow pitches.

High stability
The high-speed exposure CMOS ensures reliable image capturing and stable measurement even when targets are vibrating. Moreover, the Monitor CMOS cancels errors resulting from tilted targets.

Increased durability
The no moving parts design reduces the need for maintenance. The LED light source is less affected by electrical noise, resulting in stable use in factory environments for longer periods.

Ultra-thin wire (Ø10 µm) can be measured
New, specialized ultra-fine diameter/gap tool ensures reliable measurement of wires 10 µm in diameter.

World’s first in-line 2D optical micrometer

New 2D multi measurement system takes IN LINE, measurements with micron precision

The new Keyence TM-3000 2D Optical Micrometer introduces significant technological advancements to 100% automated high-speed, in-line or off-line measurement and inspection applications. The TM-3000 is designed to combine the functionality of a laser scan micrometer, machine vision system and optical comparator into a single device. It is available in three sensor head sizes along with the ability to utilise 2 transmitter-receiver pairs simultaneously to provide unparalleled flexibility. This newly developed high speed 2D optical micrometer includes a high-speed computing CPU and two dedicated image processing DSPs. Using a total of four processors for parallel processing, TM-3000 Series allows for fast processing of 1800 (images)/minute.

New Technology - 2D micron measurement precision
The 2D Optical Micrometer employs a dual telecentric lens to create uniform collimated light with a green LED. A two dimensional CMOS array then detects the light to dark transitions on the 2D array to measure the dimensions. Certificates of traceability along with calibration certificates are available upon request. High speed and high precision are a result of sub-pixel processing only in the areas or points designated for measurement. TM-3000 Series offer a ±0.15 μm repeatability.

Multi-Point measurement with no target positioning required
Because the system works in two dimensions it can measure up to 16 points within the measurement area. A combination of 15 measurement modes and 8 auxiliary modes can support measurements including, but not limited to, hole diameter, center pitch, intersection point, radius, width, angle, perpendicular distance and area. The position correction function automatically orients the test part prior to measurement, thus increasing accuracy. No longer are expensive positioning mechanisms needed to ensure the best precision. All programming and monitoring can be performed with or without a PC.