Testing over the air!

A new solution that combines Microwave Vision Group's (MVG) multi-probe OTA (Over The Air) test systems with Anritsu's Wireless Connectivity Test Set MT8862A to support IEEE 802.11be (Wi-Fi 7) OTA measurements has been announced.

Keita Masuhara, Product Manager, IoT Test Solutions Div., Anritsu Corporation, said: "We are pleased to be able to provide high-quality Wi-Fi 7 OTA measurement solutions through our collaboration with MVG. We will continue to collaborate with industry leaders like MVG to provide our customers with a more stable and efficient measurement environment."

Wi-Fi 7 is a standard designed to achieve high throughput for use cases such as ultra-high-definition video streaming, multi-user AR/VR/XR, and immersive gaming and entertainment. It is already being integrated into high-end smartphones, AR/VR devices, routers, and is expected to see further adoption in the future.

Advanced technologies such as 320 MHz channels, 4K QAM, and MLO (Multi-Link Operation) are incorporated in Wi-Fi 7. For device vendors, ensuring and guaranteeing the RF performance of their products is a critical challenge. Therefore, the comprehensive evaluation of RF performance, including OTA measurements, is becoming increasingly essential.

This solution leverages Anritsu’s MT8862A to generate and analyze Wi-Fi 7 signals within MVG’s multi-probe OTA test systems, enabling manufacturers to efficiently perform Wi-Fi 7 RF evaluations through fast and stable measurement. Using the MT8862A's network mode, RF evaluation can be performed at all data rates of major WLAN standards, including Wi-Fi 7. The setup allows for the measurement of key parameters such as Total Radiated Power (TRP) and Total Isotropic Sensitivity (TIS).

“Integrating the MT8862A with our OTA systems brings the stability and speed needed to evaluate Wi-Fi 7 performance at every stage of development,” said Sun Kim, Product Manager at MVG. “It ensures a streamlined workflow for engineers seeking to validate EHT (Extremely High Throughput) performance.”

Seamlessly integrated within MVG’s WaveStudio platform, combining Anritsu’s instrumentation, combined with MVG’s advanced test chambers, provides a reliable and high-performance testing framework for verifying Wi-Fi 7 device compliance, helping wireless device manufacturers optimize their product development and validation processes.

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@Anritsu @AnritsuEMEA @microwavevision @NapierPR #TandM #Comms

2022 Fellow!

Awarded for for contributions to integrated signal-power isolation and integrated magnetics.

Analog Devices’ Technology Fellow Dr. Baoxing Chen has been named a 2022 IEEE Fellow for his contributions to integrated signal-power isolation and integrated magnetics. IEEE Fellow is the highest grade of IEEE membership and is recognised by the technical community as a prestigious honour and an important career achievement. The total number selected in any one year cannot exceed one-tenth of one- percent of the total voting membership.

Dr. Baoxing Chen

“I am incredibly humbled and honoured to be named an IEEE Fellow,” said Dr. Chen. “This is a testament to Analog Devices’ leadership in digital isolation technology, which is only made possible through decades of dedication from our isolation team. I am extremely fortunate to work in such a collaborative environment where innovation is nurtured and valued.”

Dr. Chen, who joined Analog Devices in 1997, was named an ADI Fellow in 2010. As the chief technologist for the Isolation Group, he pioneered iCoupler® and isoPower® digital isolation technology from inception through today’s innovations, enabling over 4.4 billion isolation channels shipped. He also heads chip scale thermoelectric harvester developments at ADI. Dr. Chen has published more than 40 papers and holds 52 US patents. Additionally, he is an adjunct professor in Northeastern University’s Electrical and Computer Engineering Department and also serves as associate editor for IEEE Transactions on Power Electronics. Dr. Chen holds a Ph.D. in Physics and a M.S. in Electrical Engineering from the University of Michigan as well as a B. S. in Physics from Nanjing University in China.

The IEEE is the world’s leading professional association for advancing technology for humanity. Through its 400,000 plus members in 160 countries, the association is a leading authority on a wide variety of areas ranging from aerospace systems, computers and telecommunications to biomedical engineering, electric power, and consumer electronics.

@ADI_News @IEEEorg #Engineering 

Leader in IC for digital imaging recognised.

Dr. Katsu Nakamura of Analog Devices has been named an IEEE Fellow. He is being recognized as a leader in the development of integrated circuits for digital imaging.

Katsu Nakamura

IEEE Fellow is the highest grade of IEEE membership and is recognized by the technical community as a prestigious honour and an important career achievement. The total number selected in any one year cannot exceed one-tenth of one- percent of the total voting membership.

Dr. Nakamura’s career at Analog Devices spans nearly 25 years. In 1994, he joined Analog Devices as a senior staff design engineer in the High-Speed Converter Group developing ADI’s early technologies in CMOS data converters for embedded applications. Dr. Nakamura subsequently led ADI’s technology development for digital imaging until 2011 when he assumed the role of product line director for ADI’s Consumer Product Group. Since 2018, Dr. Nakamura has been leading the technology strategy for ADI’s Healthcare and Consumer Business Unit. In 2005, he was named an ADI Fellow for his contributions that drove ADI’s technical and commercial breakthroughs in the consumer imaging market.

Dr. Nakamura was a co-recipient of the SRC Inventor’s Recognition Award in 1992 and holds more than 20 US patents with several patents pending. He was selected as a finalist of the 2006 EE Times ACE Innovator of the Year Award. Dr. Nakamura holds a B.S. degree in electrical engineering and M.S. and Ph.D. degrees in Electrical and Computer Engineering from Carnegie Mellon University.

@ADI_News #Recognition @IEEEorg

E-Handbook on Nanoscale electrical measurements

 Keithley Instruments has published an informative e-handbook titled "Ensuring the Accuracy of Nanoscale Electrical Measurements."

The e-handbook is divided into several topic areas:
* Nanotech Testing Challenges
* Electrical Measurement Considerations
* Electrical Noise
* Source-Measure Instruments
* Pulsing Technologies
* Avoiding Self-Heating Problems

In addition to these topics, the e-handbook provides insights on  graphene, the single-atom-thick crystal of carbon, thought by many to be the semiconductor industry's eventual replacement for silicon. A useful glossary of low-level measurement terminology and a guide to selecting instruments suitable for nanotechnology applications are included. In addition, links to a variety of webinars, white papers, and application notes relevant to each topic area are included.

The company is helping advance the state of the art in a growing list of nanotechnology applications. Six decades of experience in designing ultra-sensitive measurement tools allow Keithley to provide university, corporate, and government labs around the world with solutions for investigating new
material and device properties. Keithley partners with organizations like the Institute of Electrical and Electronics Engineers (IEEE), leading Nanotechnology Centers of Excellence, customers, and other
leading nanotechnology measurement tool vendors to create more complete nano test solutions. The insight into emerging needs provided by these working partnerships helps Keithley deliver new capabilities faster.

Award in instrumentation & measurement

The IEEE has named Dr. Reza Zoughi as the recipient of the 2011 IEEE Joseph F. Keithley  Award in Instrumentation and Measurement. Zoughi is being recognized for his contributions to microwave and millimeter wave measurement techniques for nondestructive testing and evaluation. The award, sponsored by Keithley Instruments, is presented for outstanding contributions in the field of electrical measurement. It consists of a bronze medal, a certificate, and an honorarium. The award will be presented to Zoughi on May 11, 2011, during the IEEE International Instrumentation and Measurement Technology Conference, which will be held at the Four Points by Sheraton Hangzhou, Binjiang, Hangzhou, China (10-12/5/2011).

Zoughi, a Fellow of the Institute of Electrical and Electronics Engineers (IEEE), received his B.S.E.E, M.S.E.E, and Ph.D. degrees in electrical engineering (radar remote sensing, radar systems, and microwaves) from the University of Kansas. Currently, he is the Schlumberger Distinguished Professor of Electrical and Computer Engineering at Missouri University of Science and Technology (Missouri S&T, formerly University of Missouri-Rolla).

His efforts, in the past two decades, in expanding the utility of microwave and millimeter wave inspection techniques have brought significant recognition to the field of Nondestructive Testing and Evaluation (NDT&E). Zoughi's research team has developed millimeter wave imaging systems and methods for inspecting the spray-on foam insulation (SOFI) of the space shuttle's external fuel tank, in addition to a real-time, high-resolution and portable microwave camera that is expected to find widespread utility. He has played a leading role in developing near-field microwave and millimeter wave techniques and developed near-field measurement systems using open-ended waveguide and other more sophisticated probes for evaluating a host of defects in thin and thick and layered composite structures.

Criteria considered by the award's IEEE Evaluation Committee include innovation or development, social value, uniqueness of concept, other technical accomplishments, and the quality of the nomination. The award is administered through the Technical Field Awards Council of the IEEE Awards Board and is independent of Keithley Instruments.