Tuesday, March 2, 2010

T and M catalogue published

Keithley Instruments has published its 2010 Test & Measurement Product Catalogue in CD form. The CD offers details and technical specifications on Keithley’s general-purpose and sensitive sourcing and measurement products, DC switching, RF/microwave switching, data acquisition solutions, and semiconductor test systems. Useful selector guides and tutorials simplify choosing the right solutions for specific applications.

The CD is arranged by product type and application area with sections containing Keithley’s newest offering in test and measurement:
  • Digital multimeters and systems
  • Switching and control
  • RF/microwave switching
  • Power supplies optimized for telecom device test
  • Source and measure products
  • Low level measurements and sourcing
  • Function/pulse/arbitrary/pattern generators
  • Semiconductor test
  • Optoelectronics test
  • Data acquisition products
  • Accessories
The Catalogue CD includes several new and enhanced products:
  • Basic, low current, and high voltage versions of the S530 Parametric Test System.
  • A variety of software and hardware enhancements to the company’s popular Model 4200-SCS Semiconductor Characterization System, including new support for solar cell testing and C-V measurements.
  • An enhanced version of Keithley’s ACS Basic Edition software, which supports combining high speed hardware control, device connectivity, and data management into an easy-to-use tool for part verification, debugging, and analysis.
  • A growing range of applications for Keithley’s Series 2600A System SourceMeter® Instruments.
  • The Model 3731 6x16 reed relay matrix card, the latest addition to the Series 3700 System Switch/Multimeter family.

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